I’m working on AGX Orin 64GB with our custom carrier board on R35.5.0
I did power on-off test without shutdown in High temperature.
After several power off, it stopped booting with the following error. teraterm.log (76.4 KB)
The source code is written as follows, indicating that Variable space is broken.
[edk2-nvidia/Silicon/NVIDIA/Drivers/FvbNorFlashDxe/FvbNorFlashStandaloneMm.c]
/* We're here, which means there is a non-erased Variable Integrity space
* that isn't matching our expected measurement.
*/
ASSERT (FALSE);
This problem occurs only when multiple USB devices are plugged in at high temperatures.
My question is two.
1.Is it possible for Power off to corrupt the UEFI variable area?
I think there is no write access from ubuntu.
2.Do you have any good ideas to prevent this problem?
Thanks for reply.
This Issue is caused by power off, but the link issue is caused by the Reset Setting button.
Are these really caused by the same problem?
So, it seems something in your test causes UEFI variable changes.
Please help to check if you can reproduce on the devkit or other simple method to reproduce the same issue.