May I ask how many times the orin nx module power on/off test has been tested at -15 degrees?
We don’t have this test case. But actually the temperature of SoC will go up if you keep running reboot stress without letting device cool down.
I expect it shall keep rebooting without issue.
In datasheet show power on/off hard boot this mean auto power on, Is it right.
We test power auto power on mode 2000 times is ok, but test power on/off by button, not stable same time run more than 1000 times, same time 200 times is fail, we develop is 2000 times, so NV Standard Is there any test data from the power button?
Hi,
其實有點看不懂你的英文, 能否用中文描述你這段想表示什麼？
test power on/off by button, not stable same time run more than 1000 times, same time 200 times is fail, we develop is 2000 times, so NV Standard Is there any test data from the power button?
在datasheet中有描述, Orin NX開關機測試標註是hard boot, 這裡指的是auto power on(AT)是嗎?我們在做開關機測試時, 使用auto power on mode, 一萬次都沒問題, 但是一旦改由button on(ATX), 有時會超過1000次, 有時200次以下就開機失敗, 請問Nvidia針對此Orin NX, 有沒有做過由button on的報告. 因為開關機時序是來自MCU, 請問有無可以改善建議嗎?
Hi, are you testing on devkit or custom board? Why do you do such test? What’s the delay between your two button power-on? Did you probe the power on/off sequence when boot fail?