Spi0 test

SDK version: Tegra_Linux_Sample-Root-Filesystem_R35.3.1_aarch64.tbz2

Using spi0, the device tree configuration is as shown below.

Short-circuit SPI0_MISO and SPI0_MOSI for testing, the data is inconsistent.
What is the problem?




Hi zhang.xiang,

Are you using the devkit or custom board for Orin NX?

What is 0204RUTR in your schematic? Is it a SPI device?

Please share the full dmesg for further check.

custom board for Orin NX.

LSF0204RUTR is an electronic switch.
log-spi.txt (75.0 KB)

Did you figure out what the cause of this problem is?

Check the data to modify this place. After the change is burned in, shorting SPI0_MISO and SPI0_MOSI is still wrong.

Short circuit test before U24 device is good

It seems the issue is caused from your custom design after U24 if SPI loop back test works.

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