I am using the Orin NX in my PCB which is the carrier board.
I am using two interfaces of USB3.1 (Port0 and Port1). Both of the interfaces were simulated using hyperlynx and routed according to design guidelines.
Both of the USB3 interfaces are routed the same. The USBSS trace length is 10cm, they have ESD and CMC components.
I am testing both USB3 interfaces using the same test with USB3 SSD 2TB external device.
On Port1 i have no errors and on Port0 i have errors. I need your help to figure out the reason for these errors. I attached the Kernel dmsg log which shows the failure.
My questions:
what do you think is the reason for the failures
Are there any SERDES presets which the be modified to improve SERDES quality
Is there any other supplementary data that you need for having better analysis
I don’t think that the problem is the quality of the electrical signal.
I think it is related to ORIN NX configuration of Device Tree.
In my board each USB3 port of the two is connected to USB 3 connector TYPE A.
Hi,
If your design differs from developer kit, you would need to modify device tree according to the USB lane mapping. Please check Porting Universal Serial Bus in adaptation guide:
I checked the document you addressed but i still do not find any problem.
Can you look at the device tree i attached and see if there is a problem
The USB connections in my carrier board are as follows:
USB2-0 - connected to micro USB for programming
USB3-1 (Gen1) and USB2-2 are connected to USB3 Type A connector
USB3-0 (Gen1) and USB2-1 are connected to USB3 Type A connector
Hi,
Orin NX module + Orin Nano carrier board is supported by default. If degsign of the custom board is identical to Orin Nano carrier board, you can use the default device tree. But if there is deviation in USB lane mapping, please refer to adaptation guide to modify device tree accordingly.
